DocumentCode :
708585
Title :
Reliability prediction method with field environment variation
Author :
Cai Yi-kun ; Dai Wei ; Ma Xiao-bing ; Zhao Yu
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2015
fDate :
26-29 Jan. 2015
Firstpage :
1
Lastpage :
7
Abstract :
This paper presents a novel method of field reliability prediction considering environment variation and product individual dispersion. Wiener diffusion process with drift was used for degradation modeling and a link function which presents degradation rate is introduced to model the impact of varied environment and individual dispersion. Gamma, transformed-Gamma (T-Gamma) and Normal distribution with different parameters are employed to model right-skewed, left-skewed and symmetric stress distribution in the study case. Results show obvious difference in reliability, failure intensity and failure rate compared to constant stress situation and each other. It indicates that properly modeled (proper distribution type and parameters) environmental stress is the fundamental of varied environment oriented reliability prediction. In a linear drift degradation process and Arrhenius-typ e link function situation, it is reasonable not concerning about product individual dispersion because the impact is barely small, while other situations can be studied in the same way proposed in this present paper.
Keywords :
environmental factors; gamma distribution; normal distribution; reliability theory; stochastic processes; Arrhenius-type link function situation; Wiener diffusion process; degradation modeling; degradation rate; environment oriented reliability prediction; environmental stress; failure intensity; failure rate; field environment variation; linear drift degradation process; normal distribution; product individual dispersion; reliability prediction method; stress situation; symmetric stress distribution; transformed-gamma distribution; Degradation; Diffusion processes; Dispersion; Gaussian distribution; Mathematical model; Reliability; Stress; degradation; distribution type and parameters; field reliability; individual dispersion; varied environment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2015 Annual
Conference_Location :
Palm Harbor, FL
Print_ISBN :
978-1-4799-6702-5
Type :
conf
DOI :
10.1109/RAMS.2015.7105152
Filename :
7105152
Link To Document :
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