DocumentCode
708669
Title
[Title page]
fYear
2015
fDate
23-26 March 2015
Abstract
The following topics are dealt with: array structures; integrated circuit modeling; process evaluation; parameter extraction; capacitance; resistance; and RF circuits.
Keywords
capacitance; electric resistance; integrated circuit modelling; radiofrequency integrated circuits; transistors; RF circuit; capacitance; integrated circuit modeling; parameter extraction; process evaluation; radiofrequency circuit; resistance; transistor array structure;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures (ICMTS), 2015 International Conference on
Conference_Location
Tempe, AZ
ISSN
1071-9032
Print_ISBN
978-1-4799-8302-5
Type
conf
DOI
10.1109/ICMTS.2015.7106157
Filename
7106157
Link To Document