DocumentCode :
708951
Title :
Improving IPOG´s vertical growth based on a graph coloring scheme
Author :
Feng Duan ; Yu Lei ; Linbin Yu ; Kacker, Raghu N. ; Kuhn, D. Richard
Author_Institution :
Univ. of Texas at Arlington, Arlington, TX, USA
fYear :
2015
fDate :
13-17 April 2015
Firstpage :
1
Lastpage :
8
Abstract :
We show that the vertical growth phase of IPOG is optimal for t-way test generation when t = 2, but it is no longer optimal when t is greater than 2. We present an improvement that reduces the number of tests generated during vertical growth. The vertical growth problem is modeled as a classical NP-hard problem called “Minimum Vertex Coloring”. We adopted a greedy coloring algorithm to determine the order in which missing tuples are covered during vertical growth. We implemented a revised IPOG algorithm incorporating this improvement. The experimental results show that compared with the original IPOG algorithm, which uses an arbitrary order to cover missing tuples during vertical growth, the revised IPOG algorithm reduces the number of tests for many real-life systems.
Keywords :
computational complexity; graph colouring; greedy algorithms; program testing; IPOG vertical growth; NP-hard problem; graph coloring scheme; greedy coloring algorithm; in-parameter-order-general algorithm; minimum vertex coloring; t-way test generation; Algorithm design and analysis; Color; Conferences; Greedy algorithms; NP-hard problem; Software algorithms; Testing; ACTS; Combinatorial testing; Minimum vertex coloring; Multi-way test generation; Tuple ordering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location :
Graz
Type :
conf
DOI :
10.1109/ICSTW.2015.7107444
Filename :
7107444
Link To Document :
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