Title :
BEN: A combinatorial testing-based fault localization tool
Author :
Ghandehari, Laleh Sh ; Chandrasekaran, Jaganmohan ; Yu Lei ; Kacker, Raghu ; Kuhn, D. Richard
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
Abstract :
We present a combinatorial testing-based fault localization tool called BEN. BEN takes as input three types of information, including the subject program, the source code, an input parameter model, and a combinatorial test set created based on the input parameter model. It is assumed that the combinatorial test set has already been executed, and thus the execution status of each test is known. The output of BEN is a ranking of statements in terms of their likelihood to be faulty. In the fault localization process, a small number of additional tests are generated by BEN and need to be executed by the user. In this paper, we present the major user scenarios and the highlevel design of BEN. BEN is implemented in Java and provides a graphical user interface that provides friendly access to the tool.
Keywords :
combinatorial mathematics; program testing; software engineering; source code (software); BEN; Java; combinatorial test set; combinatorial testing-based fault localization tool; input parameter model; source code; subject program; Conferences; Fault diagnosis; Graphical user interfaces; NIST; Software engineering; Software testing; BEN; Combinatorial Testing; Fault Localization;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location :
Graz
DOI :
10.1109/ICSTW.2015.7107446