DocumentCode
709047
Title
An augmented electric field integral equation formulation for dielectrics and conductors at low frequencies
Author
Tian Xia ; Hui Gan ; Wei, Michael ; Weng Cho Chew ; Braunisch, Henning ; Zhiguo Qian ; Aygun, Kemal ; Aydiner, Alaeddin
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2015
fDate
15-21 March 2015
Firstpage
209
Lastpage
214
Abstract
A full wave integral equation method for dielectrics and conductors is developed based on the augmented electric field integral equation. This method rigorously models dielectrics and conductors to solve circuit interconnects and packaging problems. By treating the two regions rigorously and solving both the internal and external problems with the augmented electric field integral equation, accurate results for dielectrics are obtained efficiently. The conductors, however, are modeled as highly lossy dielectrics. A novel integration technique is analyzed and adopted to capture the wave properties inside the conductors. A strategy of integrating this method with the mixed-form fast multipole algorithm is presented. With the fast algorithm, more complicated, multi-scale structures with a large number of unknowns can be solved. Some numerical results show the capability of this method to solve realistic circuit problems efficiently and accurately.
Keywords
conductors (electric); dielectric losses; electric field integral equations; electronics packaging; integrated circuit interconnections; augmented electric field integral equation; circuit interconnects; circuit problems; conductor model; dielectric model; external problems; internal problems; lossy dielectrics; low frequency; mixed-form fast multipole algorithm; multiscale structures; packaging problems; wave properties; Conductors; Dielectrics; Green´s function methods; Integral equations; Manganese; Surface impedance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-1992-5
Type
conf
DOI
10.1109/EMCSI.2015.7107687
Filename
7107687
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