Studying the effect of drilling uncertainty on signal propagation through vias

Author

Yansheng Wang ; Penugonda, Srinath ; Yaojiang Zhang ; Ji Chen ; Jun Fan

Author_Institution

EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA

fYear

2015

fDate

15-21 March 2015

Firstpage

365

Lastpage

369

Abstract

A differential via structure with four varying factors are defined in this paper. The Monte Carlo (MC), stochastic collocation (SC) and design of experiments (DoE) methods are employed to quantify the drilling uncertainties in the abovementioned via structure. A comparison of the results shows that the SC method is more robust and can more efficiently and accurately estimate the mean and the standard deviation of the responses, compared to the DoE method.

Keywords

Monte Carlo methods; design of experiments; drilling; electronics packaging; polynomial approximation; stochastic processes; three-dimensional integrated circuits; Monte Carlo methods; design of experiments methods; drilling uncertainty; signal propagation; stochastic collocation methods; Capacitance; Chaos; Electromagnetic compatibility; Impedance; Inductance; Polynomials; Stochastic processes; Design of Experiments (DoE); Latin Hypercube (LH); Monte Carlo (MC); Polynomial Chaos (PC); Stochastic Collocation (SC);

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on

Conference_Location

Santa Clara, CA

Print_ISBN

978-1-4799-1992-5

Type

conf

DOI

10.1109/EMCSI.2015.7107716

Filename

7107716