DocumentCode :
709062
Title :
M-sequence-based material characterisation
Author :
Monka, Carsten ; Brueckner, Sebastian ; Schoebel, Joerg
Author_Institution :
Microwave Eng. Lab., Tech. Univ. Braunschweig, Braunschweig, Germany
fYear :
2015
fDate :
16-18 March 2015
Firstpage :
21
Lastpage :
24
Abstract :
In this paper, we present a novel time domain technique for measuring the relative permittivity εr of samples based on pseudonoise test signals (M-sequences). Analog correlation is the key enabler of our system, providing high time resolution while minimising the effort required for sampling. Moreover, a linear error model is proposed and the system´s measurement uncertainty is assessed. A comparison with reference measurements of PTFE samples concludes this paper.
Keywords :
m-sequences; permittivity measurement; time-domain analysis; M-sequence-based material characterisation; PTFE samples; analog correlation; linear error model; pseudonoise test signals; reference measurements; relative permittivity measurement; system measurement uncertainty; time domain technique; Correlation; Delays; Measurement uncertainty; Microwave measurement; Permittivity measurement; Semiconductor device measurement; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (GeMiC), 2015 German
Conference_Location :
Nuremberg
Type :
conf
DOI :
10.1109/GEMIC.2015.7107742
Filename :
7107742
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=709062
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