DocumentCode :
709117
Title :
Detection of very small impurity particles in high-quality granulated sugar
Author :
Albers, Tobias ; Peichl, Markus ; Dill, Stephan
Author_Institution :
Microwaves & Radar Inst, DLR (German Aerosp. Center) Oberpfaffenhofen, Wessling, Germany
fYear :
2015
fDate :
16-18 March 2015
Firstpage :
315
Lastpage :
318
Abstract :
This paper is about first fundamental investigations whether radar technology can detect smallest impurities in the production of high-quality granulated sugar. Based on some theoretical considerations the sensitivity of microwave interaction with some reference targets and some typical impurity particles is explored using a measurement setup at predominantly W band (75 - 110 GHz). In dependence of various adjustable parameters like bi-static angle, polarization, and frequency band a selection of suitable measurement configurations is finally discussed. The goal is to detect smallest impurities primarily inside and of course as well on the surface of a sugar heap.
Keywords :
impurities; product quality; radar applications; sugar; W band; bistatic angle; frequency 75 GHz to 110 GHz; frequency band; high-quality granulated sugar production; measurement configuration selection; measurement setup; microwave interaction; polarization; radar technology; sugar heap surface; very small particle detection; Frequency measurement; Impurities; Metals; Microwave measurement; Permittivity; Radar; Sugar; Bi-static radar; W band; food monitoring; impurities; incidence angle; polarization; relative permittivity; sugar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (GeMiC), 2015 German
Conference_Location :
Nuremberg
Type :
conf
DOI :
10.1109/GEMIC.2015.7107817
Filename :
7107817
Link To Document :
بازگشت