DocumentCode
709848
Title
CpK approach for the qualification of ECC-designs with single bit failures
Author
Tempel, Georg
Author_Institution
IFD ATV ATM, Infineon Technol. Dresden GmbH, Dresden, Germany
fYear
2015
fDate
19-23 April 2015
Abstract
Embedded non-volatile memories (NVM) use extensively designed-in error correction coding solutions to assure a low chip failure rate (CFR) even with unavoidable single bit failures. The monitoring data of the bit failure rate (BFR) can be used together with a CpK approach to demonstrate the production capability with low CFRs at least for the qualification.
Keywords
embedded systems; error correction codes; failure analysis; random-access storage; BFR; CFR; CpK approach; ECC-design qualification; designed-in error correction coding solutions; embedded nonvolatile memories; low chip failure rate; monitoring data; single bit failures rate; Error correction codes; Log-normal distribution; Monitoring; Nonvolatile memory; Production; Qualifications; Standards; Non Volatile Memory; Qualification;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/IRPS.2015.7112765
Filename
7112765
Link To Document