DocumentCode :
709865
Title :
High voltage robustness of mold compounds under different environmental conditions
Author :
Paye, Julie ; Claudi, Albert ; Stecher, Matthias
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2015
fDate :
19-23 April 2015
Abstract :
To ensure a high degree of safety in electrical systems, it is essential to understand the dielectric breakdown mechanism of packaging materials under different environmental conditions. In this article, the insulation failure of various mold compounds was examined throughout electrical breakdown tests and partial discharge measurement. The obtained results suggest a high involvement of space charges in the dielectric breakdown and point out an increase of the dielectric strength with increased humidity content.
Keywords :
electric breakdown; electric strength; electronics packaging; failure analysis; moulding; partial discharge measurement; space charge; dielectric breakdown mechanism; dielectric strength; electrical breakdown tests; electrical systems; environmental conditions; high voltage robustness; humidity content; insulation failure; mold compounds; packaging materials; partial discharge measurement; space charges; Compounds; Electrodes; Humidity; Partial discharges; Space charge; dielectric breakdown; mold compound; partial discharges; space charges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
Type :
conf
DOI :
10.1109/IRPS.2015.7112792
Filename :
7112792
Link To Document :
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