Case study of process and design performance debugging with Digital Speed Sensor

Author

Chao-Wen Tzeng ; Yin-Yen Chen ; Jih-Nung Lee ; Shu-Yi Kao

Author_Institution

Realtek Semicond. Corp., Hsinchu, Taiwan

fYear

2015

fDate

27-29 April 2015

Firstpage

1

Lastpage

4

Abstract

Using speed sensor to find out the unexpected process variation and design performance degradation is getting more and more attention. In this paper, we demonstrate the industrial case of identifying process variation, with the power of in-house developed DSS (Digital Speed Sensor). The identification result is validated by TEM (Transmission Electron Microscopy). In addition, by using DSS, we can observe how the test environment results in design performance degradation, not only during the CP (Circuit Probe) test but also the board-level test.

Keywords

circuit testing; digital instrumentation; sensors; transmission electron microscopy; velocity measurement; TEM; board-level test; circuit probe test; design performance debugging; design performance degradation; digital speed sensor; transmission electron microscopy; Decision support systems; Libraries; Monitoring; Probes; Ring oscillators; Temperature measurement; Temperature sensors; Design Performance Debugging; Process Variation; Speed Sensor;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on

Conference_Location

Hsinchu

Type

conf

DOI

10.1109/VLSI-DAT.2015.7114548

Filename

7114548