DocumentCode :
710614
Title :
VTS 2014 Best Paper Award
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
3
Abstract :
Each year, VTS proudly presents the Best Paper Award to the author(s) of the most outstanding paper from those presented at the previous year\´s symposium. The candidates for this honor are initially selected based solely on the numerical ratings of the reviewers and symposium attendees, as recorded on the review forms and the session rating cards. The Best Paper Award Judges then carefully review the candidate papers as published in the proceedings. The judges provide numerical scores and comments for each candidate paper. The scores and comments are compiled to select the best paper. The paper selected by VTS 2014 Best Paper Award Judges for the Best Paper Award is: "A Built-In Self-Test Technique for Load Inductance and Lossless Current Sensing of DC-DC Converters" by Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu (Arizona State University, AZ, USA)
Keywords :
Awards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA, USA
Type :
conf
DOI :
10.1109/VTS.2015.7116242
Filename :
7116242
Link To Document :
بازگشت