DocumentCode
710621
Title
Innovative practices session 2C: New technologies, new challenges - 2
Author
Sindia, Suraj
Author_Institution
Intel, USA
fYear
2015
fDate
27-29 April 2015
Firstpage
1
Lastpage
1
Abstract
As the economics of traditional devices scaling changes, alternative solutions to increase transistor counts in semiconductor packages are being explored, including various multi-die integration techniques. These solutions include 3D die stacking, 2.5D with dies sitting side-by-side on substrate, Package-on-Package (PoP), System in Package (SiP), etc. In particular, 2.5D and 3D device integration may create new challenges and old challenges seen in multi-chip module (MCM) manufacturing also re-appear to affect new users.
Keywords
Assembly; Metals; Stacking; Three-dimensional displays; Transistors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2015.7116258
Filename
7116258
Link To Document