• DocumentCode
    710621
  • Title

    Innovative practices session 2C: New technologies, new challenges - 2

  • Author

    Sindia, Suraj

  • Author_Institution
    Intel, USA
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    As the economics of traditional devices scaling changes, alternative solutions to increase transistor counts in semiconductor packages are being explored, including various multi-die integration techniques. These solutions include 3D die stacking, 2.5D with dies sitting side-by-side on substrate, Package-on-Package (PoP), System in Package (SiP), etc. In particular, 2.5D and 3D device integration may create new challenges and old challenges seen in multi-chip module (MCM) manufacturing also re-appear to affect new users.
  • Keywords
    Assembly; Metals; Stacking; Three-dimensional displays; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116258
  • Filename
    7116258