Title :
Memory repair for high defect densities
Author :
Nicolaidis, Michael ; Papavramidou, Panagiota
Author_Institution :
TIMA, Grenoble INP, Grenoble, France
Abstract :
We illustrate that memory repair for high defect densities allows improving yield, extending circuit life, reducing power, and improving reliability, and can be used to push aggressively the limits of technology scaling. Then we present several developments enabling low-cost memory repair for high defect densities, which alllow realising this promise.
Keywords :
integrated circuit reliability; maintenance engineering; scaling circuits; extending circuit life; high defect density; low-cost memory repair; power reduction; reliability improvement; technology scaling; yield improvement; Circuit faults; Computer aided manufacturing; Integrated circuit reliability; Maintenance engineering; Power dissipation; System-on-chip;
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2015.7116277
