DocumentCode
710640
Title
Abstraction-based relation mining for functional test generation
Author
Gent, Kelson ; Hsiao, Michael S.
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear
2015
fDate
27-29 April 2015
Firstpage
1
Lastpage
6
Abstract
Functional test generation and design validation frequently use stochastic methods for vector generation. However, for circuits with narrow paths or random-resistant corner cases, purely random techniques can fail to produce adequate results. Deterministic techniques can aid this process; however, they add significant computational complexity. This paper presents a Register Transfer Level (RTL) abstraction technique to derive relationships between inputs and path activations. The abstractions are built off of various program slices. Using such a variety of abstracted RTL models, we attempt to find patterns in the reduced state and input with their resulting branch activations. These relationships are then applied to guide stimuli generation in the concrete model. Experimental results show that this method allows for fast convergence on hard-to-reach states and achieves a performance increase of up to 9× together with a reduction of test lengths compared to previous hybrid search techniques.
Keywords
program testing; RTL abstraction technique; abstraction-based relation mining; branch activation; design validation; deterministic techniques; functional test generation; hybrid search techniques; register transfer level; stimuli generation; stochastic methods; test lengths reduction; vector generation; Benchmark testing; Databases; Engines; IEEE Computer Society; Instruments; Optimization; Pipelines;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location
Napa, CA
Type
conf
DOI
10.1109/VTS.2015.7116286
Filename
7116286
Link To Document