Title :
Quantifying the quality of a systems approach
Author :
Whitehead, N. Peter ; Scherer, William T.
Author_Institution :
MITRE Corp., McLean, VA, USA
Abstract :
Determining a systems design, analysis or approach to be of high or low quality remains a subjective assessment. Our field requires the ability to objectively grade the quality of a systems approach in advance of implementation and then correlate that assessment with outcomes. We issue a call-to-arms and present a strategy for quantitatively assessing the quality of systems thinking in an unread corpus of documents based on the previously published Dimensions of Systems Thinking. This strategy involves statistical semantic characterization through a process of supervised learning, term frequency and inverse document frequency (tf-idf), cosine similarity and Naïve Bayes classifiers, specifically Rocchio classifiers and quadratic discriminant classification. The results of our study demonstrate that our proposed capability can be achieved with a high degree of selectivity.
Keywords :
formal specification; learning (artificial intelligence); systems analysis; Naive Bayes classifiers; Rocchio classifiers; cosine similarity; dimensions of systems thinking; inverse document frequency; quadratic discriminant classification; statistical semantic characterization; subjective assessment; supervised learning; systems approach quality quantification; systems design; term frequency; Information retrieval; Joints; Semantics; Smoothing methods; Supervised learning; Systems engineering and theory; Training; Systems thinking; document classification; information retrieval; naïve Bayes; natural language processing; systems approach; vector space classification; vector space model;
Conference_Titel :
Systems Conference (SysCon), 2015 9th Annual IEEE International
Conference_Location :
Vancouver, BC
DOI :
10.1109/SYSCON.2015.7116727