DocumentCode
71090
Title
A Variation-Aware Preferential Design Approach for Memory-Based Reconfigurable Computing
Author
Paul, Sudipta ; Mukhopadhyay, Saibal ; Bhunia, Swarup
Author_Institution
Intel Corp., Hillsboro, OR, USA
Volume
22
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
2449
Lastpage
2461
Abstract
Static random access memory arrays designed in sub-90-nm technologies are highly vulnerable to process variation-induced read/write/access failures. In memory-based reconfigurable computing frameworks, which use large high-density memory array, such failures lead to incorrect execution of mapped applications. It causes loss in quality of service (QoS) for digital signal processing (DSP) applications. In this paper, we analyze the effect of parameter variations on QoS in a memory-based reconfigurable computing framework. Next, we propose a preferential design approach at both application mapping and circuit level, which can significantly improve QoS and yield under large parameter variations. The proposed application mapping process considers the reliability map of a memory array and maps the important components with respect to QoS to more reliable memory blocks under performance constraint. At circuit level, we exploit the read-dominant memory access pattern to skew the memory cells for better read stability leading to improved QoS. Such a architecture/circuit codesign approach can also tolerate increased failure rate at low operating voltage, thus facilitating low-power operation. The effect of the approach is studied for two common DSP applications, namely discrete cosine transform and finite-impulse response (FIR) filter. The simulation results for FIR application show 45% improvement in power at iso-QoS and 47% in yield for a target peak signal to noise ratio at 45-nm technology.
Keywords
FIR filters; SRAM chips; discrete cosine transforms; integrated circuit reliability; quality of service; DCT; DSP applications; FIR filter; SRAM; access failures; architecture approach; circuit codesign approach; circuit level; digital signal processing applications; discrete cosine transform; finite-impulse response filter; high-density memory array; iso-QoS; low-power operation; memory blocks; memory-based reconfigurable computing frameworks; parameter variations; peak signal to noise ratio; performance constraint; process variation-induced read failures; quality of service; read-dominant memory access pattern; reliability map; size 45 nm; size 90 nm; static random access memory arrays; variation-aware preferential design approach; write failures; Delays; Digital signal processing; Discrete cosine transforms; Field programmable gate arrays; Quality of service; Reliability; Table lookup; Low power; memory; reconfigurable computing; reliability; yield; yield.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2295538
Filename
6718137
Link To Document