RF characterization to accelerate time to product

Radio Frequency (RF) is a very effective tool to characterize the different properties of devices and materials to qualify and quantify their performance in different modes of operation (not only for high frequency operation). Innovative RF techniques could be used to characterize the properties of Si substrates, for optimized performance in RF applications. The Front End Module (FEM) in wireless communication systems requires extremely linear substrates to accommodate different circuits, which could be in CMOS or in MEMS, like the RF antenna switches. These characteristics are perfectly characterized, in a non-destructive fashion, using RF techniques.