Title :
Modified dynamic reliability model for damage accumulation
Author :
Shai, Yair ; Ingman, Dov ; Suhir, Ephraim
Author_Institution :
Fac. of Ind. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
The earlier suggested model for the dynamics of element reliability distribution over a generalized strength (capacity) space [2] reflects the roles of both strength deterioration and failure processes. The present model is a modification of the previously suggested model and considers the interaction of the instantaneous stress (demand) with the instantaneous strength (capacity). Modified Smoluchowski´s probability of transition equation plays the role of the process generator allowing an iterative simulation for the processes of strength deterioration and failure from the initial strength distribution. A practical illustration of the suggested concept is demonstrated by a rather general simulation procedure, which avoids the need for any special assumptions regarding the transition rates within the processes in question. While keeping all the benefits and the attributes of the previously suggested model, the model addressed in this paper exhibits a more realistic matter-environment system behavior. The resultant damaged strength distribution shows tendency to the Weibull model, in which all the parameters change along the process. The calculated data show physically meaningful effect of the particular material parameters and environmental conditions.
Keywords :
Weibull distribution; condition monitoring; mechanical strength; reliability; Weibull model; damage accumulation; damaged strength distribution; element reliability distribution; failure processes; general simulation procedure; generalized strength space; initial strength distribution; instantaneous strength; instantaneous stress; matter-environment system behavior; modified dynamic reliability model; strength deterioration; Load modeling; Mathematical model; Optical fibers; Reliability; Resource description framework; Sociology; Stress;
Conference_Titel :
Aerospace Conference, 2015 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4799-5379-0
DOI :
10.1109/AERO.2015.7118914