Title :
A
-Band Monolithic Integrated Active Hot and Cold Noise Source
Author :
Diebold, Sebastian ; Weissbrodt, Ernst ; Massler, Hermann ; Leuther, A. ; Tessmann, A. ; Kallfass, I.
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
Abstract :
For application in radiometry or noise measurement systems, an integrated active hot-cold load (AHCL) operating in the W-band (75-110 GHz) is presented and realized as monolithic millimeter-wave integrated circuit (MMIC). It makes use of a novel circuit topology that employs only a single active noise source and monolithic integrated switches to provide a cold and a hot noise reference temperature. The AHCL provides a measured cold temperature of only 230 K and a hot temperature of 860 K around 94 GHz, thus enabling two-point radiometric calibration and absolute power measurements. The noise source of the AHCL has been fabricated as a two-port test structure too. In that configuration, it has been measured as a low-noise amplifier with a noise figure of 2.5 dB at 94 GHz proving its good noise performance. As a standalone active cold load (ACL), an excellent noise power of only 190 K at 93 GHz is achieved. The AHCL and ACL MMICs have been fabricated in 100-nm gate-length metamorphic high electron-mobility transistor technology.
Keywords :
MMIC amplifiers; calibration; high electron mobility transistors; low noise amplifiers; microwave switches; network topology; ACL MMIC; AHCL MMIC; W-band monolithic integrated active hot-cold noise source; absolute power measurements; circuit topology; cold temperature; frequency 75 GHz to 110 GHz; hot temperature; integrated active hot-cold load; low-noise amplifier; metamorphic high electron-mobility transistor technology; monolithic integrated switches; monolithic millimeter-wave integrated circuit; noise figure 2.5 dB; stand-alone active cold load; temperature 230 K; temperature 860 K; two-point radiometric calibration; two-port test structure; Frequency measurement; Noise; Noise measurement; Power measurement; Temperature measurement; Transistors; Transmission line measurements; $W$-band; Active cold load (ACL); LNA design; active hot load; active noise terminations; cold noise source; field-effect transistor (FET) switches; high electron-mobility transistor (HEMT); hot noise source; low-noise amplifier (LNA); metamorphic high electron-mobility transistor (mHEMT); millimeter-wave imaging; monolithic microwave integrated circuit (MMIC); noise measurement; noise sources; noise temperature; radiometer calibration;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2014.2299770