Title :
L-2L de-embedding method with double-T-type PAD model for millimeter-wave amplifier design
Author :
Kawai, Seitaro ; Tokgoz, Korkut Kaan ; Okada, Kenichi ; Matsuzawa, Akira
Author_Institution :
Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
For millimeter-wave CMOS circuit design, accurate device models are necessary. Especially an accurate de-embedding method is very important. Hence, precise deembedding of pad parasitics is the first and valuable step to achieve accurate device models. In this work, a new pad modeling based on an L-2L de-embedding is proposed. The pad model is derived with an assumption that characteristic impedance of transmission line becomes constant at high frequency. Every device used in an amplifier is characterized with the proposed de-embedding method, and simulation and measurement results well agree with each other up to 110 GHz.
Keywords :
CMOS analogue integrated circuits; field effect MIMIC; high-frequency transmission lines; millimetre wave amplifiers; L-2L de-embedding method; characteristic impedance; double-T-type PAD model; high frequency; millimeter-wave CMOS circuit design; millimeter-wave amplifier design; transmission line; Capacitance; Impedance; Integrated circuit modeling; Mathematical model; Power transmission lines; Semiconductor device modeling; Transmission line measurements; CMOS; De-embedding; mm-Wave; modeling; transmission line;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2015 IEEE 15th Topical Meeting on
Conference_Location :
San Diego, CA
DOI :
10.1109/SIRF.2015.7119869