DocumentCode :
71222
Title :
Bump and Underfill Effects on Thermal Behaviors of Flip-Chip LED Packages: Measurement and Modeling
Author :
Ming-Yi Tsai ; Chung-Yi Tang ; Chia-Yi Yen ; Liann-Be Chang
Author_Institution :
Dept. of Mech. Eng., Chang Gung Univ., Taoyuan, Taiwan
Volume :
14
Issue :
1
fYear :
2014
fDate :
Mar-14
Firstpage :
161
Lastpage :
168
Abstract :
The goal of this paper is to experimentally and numerically study the thermal behaviors of flip-chip (FC) light-emitting diode (LED) packages with and without underfills and, furthermore, to compare it with conventional wire-bonding LED packages in order to understand its thermal dissipation mechanism. In experimental analyses, the junction temperature Tj and surface temperatures are measured by a junction temperature tester, thermal couples, and an infrared thermal imager, whereas the numerical analysis is carried out by an ANSYS simulation. After the validation of the simulation model with experimental results, the effects of FC bump number and underfill thermal conductivity on both Tj and thermal resistance Rth of the packages are investigated by this validated model. Furthermore, a simple model of effective thermal conductivity for a composite material of bumps and underfills is proposed for thermal analysis of the FCLED packages. Thermal results for the packages are presented and discussed in terms of volume fraction and thermal conductivity for bumps and underfills in this paper.
Keywords :
electronics packaging; flip-chip devices; infrared imaging; light emitting diodes; thermal conductivity; thermal resistance; ANSYS simulation; bump effects; flip-chip LED packages; flip-chip bump number; infrared thermal imager; junction temperature; surface temperatures; thermal behaviors; thermal conductivity; thermal couples; thermal dissipation; thermal resistance; underfill effects; underfill thermal conductivity; volume fraction; Electronic packaging thermal management; Gold; Junctions; Light emitting diodes; Substrates; Temperature measurement; Thermal conductivity; Flip chip (FC); junction temperature; light-emitting diode (LED); thermal resistance;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2013.2248365
Filename :
6471193
Link To Document :
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