Title :
Effect of waveguide surface roughness on the fiber coupling efficiency of inverse tapers
Author :
Min Teng ; Ben Niu ; Kyunghun Han ; Minghao Qi
Author_Institution :
Sch. of Electr. & Comput. Eng. & Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
Abstract :
We investigate the effect of waveguide surface roughness on the coupling efficiency between silicon inverse tapers and lensed fibers. Short taper lengths of 30-50 micrometers are shown to achieve minimum coupling loss.
Keywords :
elemental semiconductors; integrated optics; optical waveguides; silicon; surface roughness; Si; coupling loss; fiber coupling efficiency; inverse tapers; lensed fibers; micrometers; size 30 mum to 50 mum; waveguide surface roughness effect; Couplings; Optical fiber couplers; Optimized production technology; Planar waveguides; Silicon;
Conference_Titel :
Optical Fiber Communications Conference and Exhibition (OFC), 2015
Conference_Location :
Los Angeles, CA
