Title :
Current enhancement by conductivity modulation in diamond JFETs for next generation low-loss power devices
Author :
Iwasaki, T. ; Kato, H. ; Yaita, J. ; Makino, T. ; Ogura, M. ; Takeuchi, D. ; Okushi, H. ; Yamasaki, S. ; Hatano, M.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
Diamond junction field-effect transistors (JFETs) were operated in bipolar-mode to enhance the drain current. In unipolar-mode, the drain current in diamond JFET is limited by low activation of boron acceptors in the p-type channel. To increase the drain current, minority carriers were injected from the n+-diamond gates to p-channel, resulting in conductivity modulation. The drain current increased by a factor of up to 8.5 with current gains of 100-2600. We confirmed that the bipolarmode operation can be performed at a high temperature of 200 oC. The combination of the bipolar-mode and high temperature operation will lead to the realization of low-loss diamond power devices.
Keywords :
bipolar transistors; boron; diamond; junction gate field effect transistors; losses; low-power electronics; minority carriers; B; acceptor activation; bipolar-mode operation; conductivity modulation; diamond JFET; diamond junction field effect transistors; drain current enhancement; high temperature operation; minority carriers; n-diamond gates; next generation low-loss power devices; p-type channel; temperature 200 degC; unipolar-mode; Conductivity; Diamonds; JFETs; Junctions; Logic gates; Modulation; Bipolar-mode operation; Diamond; JFET;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4799-6259-4
DOI :
10.1109/ISPSD.2015.7123393