Title :
Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation
Author :
Yong Zhao ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
Abstract :
In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.
Keywords :
ageing; integrated circuit reliability; integrated circuit testing; life testing; microprocessor chips; multiprocessing systems; negative bias temperature instability; AT; NBTI aging mechanism behaviour; VLIW processor; accelerated test; aging degradation detection; functional quiescent current testing; health data; lifetime prediction; power degradation; processor technology; prognostic software; quiescent current; reliability evaluation; size 90 nm; Aging; Current measurement; Degradation; Reliability; Stress; Testing; VLIW; DSP processor; IDDQ testing; NBTI; aging; functional testing; nanoelectronics; reliability testing;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
Conference_Location :
Naples
DOI :
10.1109/DTIS.2015.7127359
