Title :
Online self adjusting progressive age monitoring of timing variations
Author :
Sadeghi-Kohan, Somayeh ; Kamal, Mehdi ; McNeil, John ; Prinetto, Paolo ; Navabi, Zain
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
Transistor and interconnect wearout is accelerated with transistor scaling that results in timing variations. Progressive age measurement of a circuit can help a better prevention mechanism for reducing more aging. This requires age monitors that collect progressive age information of the circuit. This paper focuses on monitor structures for implementation of progressive age detection. The monitors are self-adjusting that they adjust themselves to detect progressive changes in the timing of a circuit. Furthermore, the monitors are designed for low hardware overhead, and certainty in reported timing changes.
Keywords :
ageing; semiconductor device reliability; transistors; circuit timing; hardware overhead; interconnect wearout; online self adjusting progressive age monitoring; progressive age detection; progressive age measurement; timing variations; transistor scaling; transistor wearout; Aging; Clocks; Monitoring; Program processors; Temperature measurement; Temperature sensors; Timing; aging phenomena; phase-shift clock; self-adjusting monitors;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
Conference_Location :
Naples
DOI :
10.1109/DTIS.2015.7127368