DocumentCode :
71446
Title :
Mass Density Evolution of Wire Explosion Observed Using X-Ray Backlight
Author :
Xinlei Zhu ; Xiaobing Zou ; Shen Zhao ; Ran Zhang ; Huantong Shi ; Haiyun Luo ; Xinxin Wang
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Volume :
42
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
3221
Lastpage :
3225
Abstract :
The evolution of single- and dual-wire Z-pinch of 8-μm W was investigated by X-ray backlighting using an X-pinch X-ray source. The experiments were carried out on the pulsed-power generator PPG-I (400 kA/500 kV/100 ns), which was designed and constructed by the Department of Electrical Engineering of Tsinghua University. To scale the mass density distributions at different explosion time, a mass step wedge including eight tungsten layers was fabricated and inserted between the object Z-pinch and the X-ray film. By a large number of imaging experiments, the physical images of coronal plasma formation and interwire plasma merging were obtained. Based on the X-ray photos of 8-μm W and mass step wedge, the mass density distributions at different explosion time were drawn, and the conductance curve of time dependence of 8-μm W was also calculated using waveform of voltage and current.
Keywords :
corona; pulsed power supplies; Department of Electrical Engineering; PPG-I; Tsinghua University; X-pinch X-ray source; X-ray backlighting; X-ray film; conductance curve; coronal plasma formation; current waveform; dual-wire Z-pinch; explosion time; interwire plasma merging; mass density evolution; mass step wedge; physical images; power 8 muW; pulsed-power generator; single-wire Z-pinch; time 100 ns; tungsten layers; voltage 400 kV; voltage 500 kV; voltage waveform; wire explosion; Educational institutions; Electrical engineering; Explosions; Plasmas; Tungsten; Wires; X-ray imaging; Mass ablation ratio; X-pinch; X-ray backlighting; X-ray backlighting.; mass density distribution;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2014.2329036
Filename :
6844886
Link To Document :
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