Title :
A generalized admittance based method for fault location analysis of distribution systems
Author :
Zhenyu Tan ; Hongbo Sun ; Nikovski, Daniel ; Takano, Tomihiro ; Kojima, Yasuhiro ; Ohno, Tetsufumi
Author_Institution :
Georgia Inst. of Technologyl, Atlanta, GA, USA
Abstract :
This paper proposes a generalized admittance based method for fault location analysis of distribution systems. Based on the measurements collected from the feeder breakers and intelligent switches during a fault, the fault type and faulted feeder section are first determined by examining the over-voltages and over-currents on the breakers/switches. The load demands, faulted line segment and fault location are then determined sequentially by finding a set of loads, a line segment and a fault location that has minimal distance between the currents measured at the boundaries of the feeder section, and the estimated currents determined by multiplying the measured voltages by an equivalent admittance matrix determined for the feeder section when applying the given load and fault conditions to the feeder section. The proposed approach determines the equivalent admittance matrix for a feeder section with one or two measuring ports through topology and circuit analysis, and for a feeder section with more than two measuring ports through Kron reduction on nodal admittance matrix. Numerical examples are given to demonstrate the effectiveness of the proposed approach.
Keywords :
circuit breakers; electric admittance; fault location; matrix algebra; power distribution faults; Kron reduction; circuit analysis; distribution systems; fault conditions; fault location analysis; faulted feeder section; faulted line segment; feeder breakers; generalized admittance based method; intelligent switches; load demands; nodal admittance matrix; over-current examination; over-voltage examination; Admittance; Admittance measurement; Circuit faults; Current measurement; Fault location; Phase measurement; Voltage measurement; Distribution system; equivalent admittance matrix; fault location analysis; short circuit fault;
Conference_Titel :
Innovative Smart Grid Technologies Conference (ISGT), 2015 IEEE Power & Energy Society
Conference_Location :
Washington, DC
DOI :
10.1109/ISGT.2015.7131908