DocumentCode :
715565
Title :
Semi-analytical modeling of an eddy current imaging system for the characterization of defects in metallic structures
Author :
Bore, T. ; Placko, D. ; Joubert, P.-Y.
Author_Institution :
SATIE, ENS Cachan, Cachan, France
fYear :
2015
fDate :
13-15 April 2015
Firstpage :
1
Lastpage :
5
Abstract :
In this paper, the authors report on the implementation of a simplified and computationally efficient electromagnetic modeling of the interactions that take place between an eddy current imaging device and a metallic assembly, in the context of the non destructive evaluation of defects in metallic parts. The model is implemented in the case of the evaluation of a millimetric defect buried in a three plate aluminum assembly, for eddy current frequencies ranging from 300Hz to 3kHz. The model is validated against experimental data in terms of two-dimensional distributions of the computed magnetic field, as well as in terms of modulus and phase of the magnetic extrema observed in the images, in the whole frequency range. The obtained result provides promising prospects for the use of such model for the automatic characterization of defects in the context of the eddy current imaging of metallic parts.
Keywords :
aluminium; assembling; crack detection; eddy current testing; electromagnetic devices; millimetre wave imaging; 2D computed magnetic field distribution; automatic defect characterization; eddy current imaging system; electromagnetic modeling; frequency 300 Hz to 3 kHz; metallic assembly; metallic structure; millimetric defect evaluation; nondestructive evaluation; three plate aluminum assembly; Assembly; Computational modeling; Eddy currents; Electrostatic discharges; Magnetic fields; Magnetic resonance imaging; Buried defects; Distributed Points Sources Method (DPSM); Eddy Current Imager (ECI); Eddy currents; Electromagnetic modeling; Experimental validation; Non Destructive Evaluation (NDE);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors Applications Symposium (SAS), 2015 IEEE
Conference_Location :
Zadar
Type :
conf
DOI :
10.1109/SAS.2015.7133630
Filename :
7133630
Link To Document :
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