DocumentCode :
71586
Title :
Photoresponse properties of p-type ZnSe nanowire photodetectors
Author :
Shanying Li ; Qing Su ; Haipeng Zhao
Author_Institution :
Sch. of Chem. & Mater. Eng., Henan Univ. of Urban Constr., Pingdingshan, China
Volume :
8
Issue :
9
fYear :
2013
fDate :
Sep-13
Firstpage :
496
Lastpage :
499
Abstract :
Nanophotodetectors are constructed based on individual p-type ZnSe nanowires (NWs), and the photoresponse properties are investigated. The nanophotodetectors show high sensitivity and fast response speed to the incident light with a sharp cutoff at 470 nm. The light-to-dark currents ratio Ilight/Idark is approximately two orders of magnitude; photoconduction is 20.5 nS at incident light intensity of 5.11 mWcm-2. The response characteristics reveal that different energy levels (shallow and deep) in the bandgap and defects on the NW surface play an important role in the recombination. The ZnSe NW photodetector with good reliability and reproducibility will have great potential application in optoelectronic nanodevices.
Keywords :
II-VI semiconductors; crystal defects; energy states; nanowires; photodetectors; reliability; semiconductor quantum wires; wide band gap semiconductors; zinc compounds; ZnSe; bandgap; defects; energy levels; incident light intensity; individual p-type ZnSe nanowire; light-to-dark currents ratio; nanophotodetectors; optoelectronic nanodevice; p-type ZnSe nanowire photodetectors; photoconduction; photoresponse properties; recombination; reliability; response speed;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2013.0085
Filename :
6649647
Link To Document :
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