DocumentCode
71586
Title
Photoresponse properties of p-type ZnSe nanowire photodetectors
Author
Shanying Li ; Qing Su ; Haipeng Zhao
Author_Institution
Sch. of Chem. & Mater. Eng., Henan Univ. of Urban Constr., Pingdingshan, China
Volume
8
Issue
9
fYear
2013
fDate
Sep-13
Firstpage
496
Lastpage
499
Abstract
Nanophotodetectors are constructed based on individual p-type ZnSe nanowires (NWs), and the photoresponse properties are investigated. The nanophotodetectors show high sensitivity and fast response speed to the incident light with a sharp cutoff at 470 nm. The light-to-dark currents ratio Ilight/Idark is approximately two orders of magnitude; photoconduction is 20.5 nS at incident light intensity of 5.11 mWcm-2. The response characteristics reveal that different energy levels (shallow and deep) in the bandgap and defects on the NW surface play an important role in the recombination. The ZnSe NW photodetector with good reliability and reproducibility will have great potential application in optoelectronic nanodevices.
Keywords
II-VI semiconductors; crystal defects; energy states; nanowires; photodetectors; reliability; semiconductor quantum wires; wide band gap semiconductors; zinc compounds; ZnSe; bandgap; defects; energy levels; incident light intensity; individual p-type ZnSe nanowire; light-to-dark currents ratio; nanophotodetectors; optoelectronic nanodevice; p-type ZnSe nanowire photodetectors; photoconduction; photoresponse properties; recombination; reliability; response speed;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2013.0085
Filename
6649647
Link To Document