• DocumentCode
    71586
  • Title

    Photoresponse properties of p-type ZnSe nanowire photodetectors

  • Author

    Shanying Li ; Qing Su ; Haipeng Zhao

  • Author_Institution
    Sch. of Chem. & Mater. Eng., Henan Univ. of Urban Constr., Pingdingshan, China
  • Volume
    8
  • Issue
    9
  • fYear
    2013
  • fDate
    Sep-13
  • Firstpage
    496
  • Lastpage
    499
  • Abstract
    Nanophotodetectors are constructed based on individual p-type ZnSe nanowires (NWs), and the photoresponse properties are investigated. The nanophotodetectors show high sensitivity and fast response speed to the incident light with a sharp cutoff at 470 nm. The light-to-dark currents ratio Ilight/Idark is approximately two orders of magnitude; photoconduction is 20.5 nS at incident light intensity of 5.11 mWcm-2. The response characteristics reveal that different energy levels (shallow and deep) in the bandgap and defects on the NW surface play an important role in the recombination. The ZnSe NW photodetector with good reliability and reproducibility will have great potential application in optoelectronic nanodevices.
  • Keywords
    II-VI semiconductors; crystal defects; energy states; nanowires; photodetectors; reliability; semiconductor quantum wires; wide band gap semiconductors; zinc compounds; ZnSe; bandgap; defects; energy levels; incident light intensity; individual p-type ZnSe nanowire; light-to-dark currents ratio; nanophotodetectors; optoelectronic nanodevice; p-type ZnSe nanowire photodetectors; photoconduction; photoresponse properties; recombination; reliability; response speed;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2013.0085
  • Filename
    6649647