• DocumentCode
    715908
  • Title

    A practical approach for logic simplification based on fault acceptability for error tolerant application

  • Author

    Ichihara, Hideyuki ; Kamei, Junpei ; Iwagaki, Tsuyoshi ; Inoue, Tomoo

  • Author_Institution
    Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
  • fYear
    2015
  • fDate
    25-29 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we focus on fault-acceptability-based logic simplification for error tolerant application. We propose a practical (or cost-effective) logic simplification algorithm. The proposed algorithm (1) avoids acceptability identification for faults that are potentially unacceptable and (2) isolates redundancy identification procedure from acceptability identification. Experimental results show that, compared with a previous algorithm, the proposed algorithm can reduce the computational effort without losing the ability of logic simplification.
  • Keywords
    integrated circuit testing; logic testing; redundancy; acceptability identification; error tolerant application; fault acceptability; logic simplification algorithm; redundancy identification procedure; Circuit faults; Cities and towns; Combinational circuits; Fault diagnosis; Redundancy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2015 20th IEEE European
  • Conference_Location
    Cluj-Napoca
  • Type

    conf

  • DOI
    10.1109/ETS.2015.7138727
  • Filename
    7138727