Software-based self-test techniques of computational modules in dual issue embedded processors

Author

Bernardi, P. ; Bovi, C. ; Cantoro, R. ; De Luca, S. ; Meregalli, R. ; Piumatti, D. ; Sanchez, E. ; Sansonetti, A.

Author_Institution

Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy

fYear

2015

fDate

25-29 May 2015

Firstpage

1

Lastpage

2

Abstract

Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.

Keywords

embedded systems; program testing; system-on-chip; automotive System-on-Chip; computational modules; dual issue embedded processors; processor; program testing; software based self-test techniques; testing embedded processors; Automotive engineering; Built-in self-test; Pipelines; Program processors; Registers; Synchronization; SBST; dual issue processors; pipeline;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ETS), 2015 20th IEEE European

Conference_Location

Cluj-Napoca

Type

conf

DOI

10.1109/ETS.2015.7138730

Filename

7138730