Title :
A soft-error tolerant TCAM using partial don´t-care keys
Author :
Syafalni, Infall ; Sasao, Tsutomu ; Xiaoqing Wen ; Holst, Stefan ; Miyase, Kohei
Abstract :
This paper proposes a novel soft-error tolerant TCAM using partial don´t-care keys (X-keys), namely TX, which significantly enhances the tolerance of the TCAM against soft errors. Experimental results show that the soft-error tolerance of the TX outperforms existing schemes. Moreover, the overhead of the TX is very small.
Keywords :
content-addressable storage; radiation hardening (electronics); TX overhead; X-keys; partial don´t-care keys; soft-error tolerant TCAM; ternary content addressable memory; Associative memory; Electronic mail; Europe; Indexes; Random access memory; Standards; Testing;
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
DOI :
10.1109/ETS.2015.7138743
