DocumentCode :
715922
Title :
Testing visions
Author :
Wunderlich, Hans-Joachim
fYear :
2015
fDate :
25-29 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Most of the fundamental ideas and concepts of VLSI testing were not recognized initially, and needed some time to find their place in practice. It is not easy for contemporaries to judge what are visions and what are just wild and crazy ideas. In this talk, we make a journey from the beginnings of semiconductor testing to some goals of the future, identifying the milestones of the past and guessing some useful visions of tomorrow.
Keywords :
VLSI; integrated circuit testing; monolithic integrated circuits; VLSI testing; semiconductor testing; testing visions; very large scale integration; Europe; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
Type :
conf
DOI :
10.1109/ETS.2015.7138750
Filename :
7138750
Link To Document :
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