DocumentCode
715922
Title
Testing visions
Author
Wunderlich, Hans-Joachim
fYear
2015
fDate
25-29 May 2015
Firstpage
1
Lastpage
1
Abstract
Most of the fundamental ideas and concepts of VLSI testing were not recognized initially, and needed some time to find their place in practice. It is not easy for contemporaries to judge what are visions and what are just wild and crazy ideas. In this talk, we make a journey from the beginnings of semiconductor testing to some goals of the future, identifying the milestones of the past and guessing some useful visions of tomorrow.
Keywords
VLSI; integrated circuit testing; monolithic integrated circuits; VLSI testing; semiconductor testing; testing visions; very large scale integration; Europe; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location
Cluj-Napoca
Type
conf
DOI
10.1109/ETS.2015.7138750
Filename
7138750
Link To Document