Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies

Author

Yu Huang ; Wu Yang ; Wu-Tung Cheng

Author_Institution

Mentor Graphics Corp., Wilsonville, OR, USA

fYear

2015

fDate

25-29 May 2015

Firstpage

1

Lastpage

10

Abstract

In this paper, we surveyed the recent advancements in DDYA, which includes scan-based diagnosis technologies and diagnosis driven yields analysis. Multiple industrial cases studies are given to illustrate the values of the DDYA flow. By using the advanced DDYA, diagnosis can be more accurate, fast and informative. More importantly it can help improve yield by finding the systematic defect, identifying the root causes, correlating diagnosis results with DFM and picking highly possible die and suspect for PFA to validate all the findings.

Keywords

design for manufacture; failure analysis; integrated circuit yield; DDYA; DFM; PFA; correlating diagnosis results; design for manufacture; diagnosis driven yield analysis; multiple industrial case; physical failure analysis; root cause; scan-based diagnosis technology; state-of-the-art scan diagnosis; systematic defect; yield analysis technology; Automatic test pattern generation; Bridges; Circuit faults; Fault diagnosis; Statistical analysis; System-on-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ETS), 2015 20th IEEE European

Conference_Location

Cluj-Napoca

Type

conf

DOI

10.1109/ETS.2015.7138758

Filename

7138758