A new technique for low-cost phase noise production testing from 1-bit signal acquisition

Author

David-Grignot, S. ; Azais, F. ; Latorre, L. ; Lefevre, F.

Author_Institution

LIRMM, Univ. Montpellier, Montpellier, France

fYear

2015

fDate

25-29 May 2015

Firstpage

1

Lastpage

6

Abstract

This paper introduces a new technique for low-cost phase noise production testing from 1-bit signal acquisition. The technique relies on reconstruction of phase fluctuation from the binary vector captured by a digital ATE channel. A dedicated post-processing algorithm is developed that permits phase noise evaluation from the analysis of the reconstructed time-domain phase fluctuation. The technique is validated through hardware measurements and results demonstrate an excellent agreement with conventional phase noise measurements.

Keywords

analogue integrated circuits; automatic test pattern generation; integrated circuit noise; integrated circuit testing; noise measurement; phase noise; radiofrequency integrated circuits; signal detection; automatic test equipment; binary vector; digital ATE channel; hardware measurements; low-cost phase noise production testing; phase noise evaluation; phase noise measurements; post-processing algorithm; signal acquisition; time-domain phase fluctuation; Fluctuations; Image reconstruction; Noise measurement; Phase noise; Radio frequency; Standards; Time-domain analysis; 1bit acquisition; analog signals; digital ATE; digital signal processing; phase noise; test cost reduction;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ETS), 2015 20th IEEE European

Conference_Location

Cluj-Napoca

Type

conf

DOI

10.1109/ETS.2015.7138761

Filename

7138761