DocumentCode :
715930
Title :
A new technique for low-cost phase noise production testing from 1-bit signal acquisition
Author :
David-Grignot, S. ; Azais, F. ; Latorre, L. ; Lefevre, F.
Author_Institution :
LIRMM, Univ. Montpellier, Montpellier, France
fYear :
2015
fDate :
25-29 May 2015
Firstpage :
1
Lastpage :
6
Abstract :
This paper introduces a new technique for low-cost phase noise production testing from 1-bit signal acquisition. The technique relies on reconstruction of phase fluctuation from the binary vector captured by a digital ATE channel. A dedicated post-processing algorithm is developed that permits phase noise evaluation from the analysis of the reconstructed time-domain phase fluctuation. The technique is validated through hardware measurements and results demonstrate an excellent agreement with conventional phase noise measurements.
Keywords :
analogue integrated circuits; automatic test pattern generation; integrated circuit noise; integrated circuit testing; noise measurement; phase noise; radiofrequency integrated circuits; signal detection; automatic test equipment; binary vector; digital ATE channel; hardware measurements; low-cost phase noise production testing; phase noise evaluation; phase noise measurements; post-processing algorithm; signal acquisition; time-domain phase fluctuation; Fluctuations; Image reconstruction; Noise measurement; Phase noise; Radio frequency; Standards; Time-domain analysis; 1bit acquisition; analog signals; digital ATE; digital signal processing; phase noise; test cost reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
Type :
conf
DOI :
10.1109/ETS.2015.7138761
Filename :
7138761
Link To Document :
بازگشت