Title :
A fault tolerant response analyzer with self-error-correction capability
Author :
Fukazawa, Yuki ; Ichihara, Hideyuki ; Inoue, Tomoo
Author_Institution :
Grad. Sch. of Eng., Mie Univ., Tsu, Japan
Abstract :
Reliable built-in self-test (Reliable BIST) scheme equips to be tolerant of faults, which occur in embedded BIST circuits. To realize reliable BIST, it is required to recover itself from transient errors of its embedded BIST circuits. In this paper, we propose a self-error-correctable response analyzer (RA) for a reliable BIST scheme. Experimental results show that test-reliability of SECRA is superior to TMR MISRs on the assumption that transient faults occur in RA during testing CUTs.
Keywords :
built-in self test; error correction; fault tolerance; SECRA test-reliability; embedded BIST circuits; fault tolerant response analyzer; reliable BIST; reliable built-in self-test; self-error-correctable response analyzer; self-error-correction capability; transient errors; Built-in self-test; Circuit faults; Logic gates; Reliability; Transient analysis; Tunneling magnetoresistance; Fault tolerance; cyclic code; response analyzers; test-reliability; transient faults;
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
DOI :
10.1109/ETS.2015.7138764
