Title :
Efficient diagnosis technique for aging defects on automotive semiconductor chips
Author :
Jihun Jung ; Ansari, Muhammad Adil ; Dooyoung Kim ; Hyunbean Yi ; Sungju Park
Author_Institution :
Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea
Abstract :
The semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches.
Keywords :
ageing; automotive electronics; flip-flops; power consumption; semiconductor devices; aging effect prediction; aging monitoring operation; automotive semiconductor chips; automotive semiconductor device; capture timing; efficient diagnosis technique; power consumption; semiconductor aging defects; Aging; Clocks; Estimation; Flip-flops; Monitoring; Power demand; Timing; aging monitoring; on-line test; scan flip-flop;
Conference_Titel :
Test Symposium (ETS), 2015 20th IEEE European
Conference_Location :
Cluj-Napoca
DOI :
10.1109/ETS.2015.7138767
