Title :
Micromechanical piezoelectric-on-silicon BAW resonators for sensing in liquid environments
Author :
Prasad, Abhinav ; Seshia, Ashwin A. ; Charmet, Jerome
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
Abstract :
This paper reports micromachined piezoelectric-on-silicon bulk acoustic wave resonators operating at a nominal frequency of approximately 3.15 MHz in fluidic media. Electrical measurements of the open-loop response of the resonators when one of the resonator surfaces is submerged in water indicate high quality factors in the range of 110-190. These values of quality factor are at least an order of magnitude higher than the flexural mode counterparts. The resonators are further exposed to Glycerol-Water mixtures of varying viscosity-density resulting in characteristic negative resonant frequency shifts. Experimental values are compared with a simplified liquid loading model and an agreement of up to 13% for highest and within 3-4% for lowest glycerol concentrations is established. These devices due to the relative ease of operation in liquid environments, scalability, high quality-factors and high mass-sensitivity have the potential for integration with microfluidics and electronics in order to realize an integrated platform for biochemical sensing and analysis.
Keywords :
Q-factor; acoustic resonators; biosensors; bulk acoustic wave devices; chemical sensors; crystal resonators; elemental semiconductors; liquid mixtures; micromechanical resonators; organic compounds; silicon; water; Si; biochemical sensing; electrical measurements; glycerol-water mixtures; high mass-sensitivity; high quality-factors; liquid environments; micromechanical piezoelectric-on-silicon BAW resonators; open-loop response; quality factors; scalability; viscosity-density; Electrodes; Liquids; Loading; Optical resonators; Q-factor; Resonant frequency; Sensors; BAW resonator; MEMS; liquid sensing; piezoelectric transducer;
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
DOI :
10.1109/FCS.2015.7138825