DocumentCode :
716008
Title :
The effect of contour concentricity on the acceleration sensitivity of quartz crystal resonators
Author :
Morley, Peter E.
Author_Institution :
Vectron Int., Cincinnati, OH, USA
fYear :
2015
fDate :
12-16 April 2015
Firstpage :
427
Lastpage :
431
Abstract :
Optimization of the acceleration sensitivity of quartz crystal resonators has been a challenging problem for resonator designers for decades. The structural symmetry of the resonator and mount combination has been shown in past work, both theoretical and practical, to have a strong influence on acceleration sensitivity, and specialized structures have been developed [1], [2], [3] that have greatly improved performance. However, with applications such as airborne radar systems, there is a persistent demand for further improvement. The design of many of the practical high-stability resonator products that have a need for good acceleration sensitivity is also constrained by other attributes, such as high quality factor, and these constraints typically result in a low-frequency overtone device with a fully contoured resonator element design. In this paper, the effect of the concentricity of the contour shape on the quartz disk in contoured resonators is considered, and results are presented that demonstrate a strong correlation between the contour offset from the blank center and the acceleration sensitivity of the resonator. Methods are also described for measurement of the contour position relative to the perimeter of the disk.
Keywords :
Q-factor; acceleration measurement; crystal resonators; acceleration sensitivity; contour concentricity; quality factor; quartz crystal resonators; quartz disk; Acceleration; Crystals; Electrodes; Frequency control; Optical resonators; Resonant frequency; Sensitivity; Quartz crystal; acceleration; contoured; g-sensitivity; optical measurement; resonator; sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
Type :
conf
DOI :
10.1109/FCS.2015.7138873
Filename :
7138873
Link To Document :
بازگشت