DocumentCode
716009
Title
Anchor loss suppression using butterfly-shaped plates for AlN Lamb wave resonators
Author
Jie Zou ; Chih-Ming Lin ; Pisano, Albert P.
Author_Institution
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
fYear
2015
fDate
12-16 April 2015
Firstpage
432
Lastpage
435
Abstract
The use of butterfly-shaped thin plates, formed by reducing the tether-to-plate angle, can raised the quality factor (Q) of aluminum nitride (AlN) Lamb wave resonators (LWRs) by eliminating the anchor loss. The finite element analysis (FEA) simulation results show that the butterfly-shaped plate can efficiently keep the vibration far from the edges at the tether-to-plate plane, so that the acoustic wave leaky through the supporting tethers is reduced. Specifically, the rounded butterfly-shaped resonators show more efficient suppression in the anchor loss compared to the beveled butterfly-shaped resonators. The measured frequency response for a 863-MHz AlN LWR with 45° beveled tether-to-plate transition yields a Q of 1,979 which upwards 30% over a conventional rectangular resonator; another AlN LWR on the butterfly-shaped plate with rounded tether-to-plate transition yields a Q of 2,531, representing a 67% improvement.
Keywords
III-V semiconductors; Q-factor; UHF resonators; aluminium compounds; finite element analysis; frequency response; surface acoustic wave resonators; wide band gap semiconductors; AlN; aluminum nitride Lamb wave resonators; anchor loss suppression; butterfly-shaped thin plates; finite element analysis; frequency 863 MHz; frequency response; quality factor; tether-to-plate transition; Aluminum nitride; III-V semiconductor materials; Micromechanical devices; Q-factor; Resonant frequency; Substrates; Vibrations; Lamb wave resonators; RF MEMS; aluminum nitride (AlN); anchor loss; butterfly-shaped plate; piezoelectric resonators; quality factor (Q);
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location
Denver, CO
Print_ISBN
978-1-4799-8865-5
Type
conf
DOI
10.1109/FCS.2015.7138874
Filename
7138874
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