DocumentCode
716084
Title
Inverse depth for accurate photometric and geometric error minimisation in RGB-D dense visual odometry
Author
Gutierrez-Gomez, Daniel ; Mayol-Cuevas, Walterio ; Guerrero, J.J.
Author_Institution
Dept. de Inf. e Ing. de Sist. (DIIS), Univ. de Zaragoza, Zaragoza, Spain
fYear
2015
fDate
26-30 May 2015
Firstpage
83
Lastpage
89
Abstract
In this paper we present a dense visual odometry system for RGB-D cameras performing both photometric and geometric error minimisation to estimate the camera motion between frames. Contrary to most works in the literature, we parametrise the geometric error by the inverse depth instead of the depth, which translates into a better fit of the distribution of the geometric error to the used robust cost functions. We also provide a unified evaluation under the same framework of different estimators and ways of computing the scale of the residuals which can be found spread along the related literature. For the comparison of our approach with state-of-the-art approaches we use the popular dataset from the TUM for RGB-D benchmarking. Our approach shows to be competitive with state-of-the-art methods in terms of drift in meters per second, even compared to methods performing loop closure too. When comparing to approaches performing pure odometry like ours, our method outperforms them in the majority of the tested datasets. Additionally we show that our approach is able to work in real time and we provide a qualitative evaluation on our own sequences showing a low drift in the 3D reconstructions.
Keywords
distance measurement; image colour analysis; image reconstruction; motion estimation; photometry; 3D reconstructions; RGB-D benchmarking; RGB-D cameras; RGB-D dense visual odometry; TUM; camera motion estimation; cost functions; geometric error minimisation; photometric error minimisation; Cameras; Cost function; Maximum likelihood estimation; Three-dimensional displays; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation (ICRA), 2015 IEEE International Conference on
Conference_Location
Seattle, WA
Type
conf
DOI
10.1109/ICRA.2015.7138984
Filename
7138984
Link To Document