Title :
An approach to specification simplification in automated manufacturing systems using invariance and inequality analysis
Author :
Chen Chen ; Hesuan Hu
Author_Institution :
Sch. of Electro-Mech. Eng., Xidian Univ., Xi´an, China
Abstract :
Supervisory control techniques (SCTs), as one of the fundamental researches in the domain of automated manufacturing systems, implement specifications upon a plant model, leading the system to tendentiously desired behaviors. Generalized Mutual Exclusion Constraints (GMECs) are a typical kind of SCTs which correspond to a linear supervisory specification in the context of Petri nets (PNs). Given a set of admissible GMECs, supervisor simplification is needed to reduce implementation cost and mitigate fabrication complexity. In this paper, two methods are proposed and improved in the paradigm of arbitrary GMECs simplification. For the method based on P-invariant control, it develops in the semantics of PN structure analysis, exhibiting drawbacks like low computational efficiency, high failure probability, and definite failure to control weakly L1-dependent inequalities. On the contrary, for the method based on inequality analysis, it germinates on the ground of algebra theory, tackling both L1- and L2-dependent inequalities. Experimental results show the effectiveness and efficiency of supervisor simplification based on inequality analysis.
Keywords :
Petri nets; manufacturing systems; process control; GMECs; P-invariant control; PN structure analysis; Petri nets; SCTs; algebra theory; automated manufacturing systems; cost reduction; fabrication complexity mitigation; generalized mutual exclusion constraints; high failure probability; inequality analysis; invariance analysis; linear supervisory specification simplification; low computational efficiency; plant model; supervisory control techniques; weakly L1-dependent inequality; Algebra; Automation; Manufacturing systems; Mathematical model; Petri nets; Semantics; Supervisory control;
Conference_Titel :
Robotics and Automation (ICRA), 2015 IEEE International Conference on
Conference_Location :
Seattle, WA
DOI :
10.1109/ICRA.2015.7139734