DocumentCode
716670
Title
Sparse Depth Odometry: 3D keypoint based pose estimation from dense depth data
Author
Manoj, Prakhya Sai ; Liu Bingbing ; Lin Weisi ; Qayyum, Usman
Author_Institution
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2015
fDate
26-30 May 2015
Firstpage
4216
Lastpage
4223
Abstract
This paper presents Sparse Depth Odometry (SDO) to incrementally estimate the 3D pose of a depth camera in indoor environments. SDO relies on 3D keypoints extracted on dense depth data and hence can be used to augment the RGB-D camera based visual odometry methods that fail in places where there is no proper illumination. In SDO, our main contribution is the design of the keypoint detection module, which plays a vital role as it condenses the input point cloud to a few keypoints. SDO differs from existing depth alone methods as it does not use the popular signed distance function and can run online, even without a GPU. A new keypoint detection module is proposed via keypoint selection, and is based on extensive theoretical and experimental evaluation. The proposed keypoint detection module comprises of two existing keypoint detectors, namely SURE [1] and NARF [2]. It offers reliable keypoints that describe the scene more comprehensively, compared to others. Finally, an extensive performance evaluation of SDO on benchmark datasets with the proposed keypoint detection module is presented and compared with the state-of-the-art.
Keywords
cameras; feature extraction; image colour analysis; object detection; pose estimation; 3D keypoint based pose estimation; 3D keypoint extraction; NARF keypoint detector; RGB-D camera based visual odometry method; SDO; SURE keypoint detector; dense depth data; depth camera; keypoint detection module; keypoint selection; red-green-blue-depth; signed distance function; sparse depth odometry; Cameras; Computational modeling; Covariance matrices; Detectors; Estimation; Three-dimensional displays; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation (ICRA), 2015 IEEE International Conference on
Conference_Location
Seattle, WA
Type
conf
DOI
10.1109/ICRA.2015.7139780
Filename
7139780
Link To Document