I-V characteristics analysis of YBCO step-edge grain-boundary Josephson junctions

Author

Esmaeili, Mohaddeseh ; Mohajeri, Roya ; Nazifi, Rana ; Vesaghi, Mohammad Ali ; Fardmanesh, Mehdi

Author_Institution

Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran

fYear

2015

fDate

10-14 May 2015

Firstpage

1403

Lastpage

1405

Abstract

We have measured and analyzed the I-V characteristics of high temperature superconductor (Y-Ba-Cu-O) single step edge Josephson junctions with two different widths versus temperatures down to 3.3K. The junctions showed the resistively shunted junction behavior. And the flux flow behavior was observed in some regions of operation of the 5μm wide junction characteristics which was analyzed according to the estimated penetration depth of the junction.

Keywords

flux flow; high-temperature superconductors; superconducting junction devices; yttrium compounds; I-V characteristics analysis; YBCO step-edge grain-boundary Josephson junctions; YBa₂Cu₃O₇; flux flow behavior; high temperature superconductor single step edge Josephson junctions; junction characteristics; shunted junction behavior; size 5 mum; Conferences; Decision support systems; Electrical engineering; I-V characteristics; flux-flow behavior; step-edge Josephson junctions;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Engineering (ICEE), 2015 23rd Iranian Conference on

Conference_Location

Tehran

Print_ISBN

978-1-4799-1971-0

Type

conf

DOI

10.1109/IranianCEE.2015.7146439

Filename

7146439