DocumentCode
718540
Title
Equipment for testing and diagnostics of power semiconductor devices
Author
Bespalov, N.N. ; Ilyin, M.V. ; Kapitonov, S.S.
Author_Institution
Dept. of Electron. & Nanoelectron., Ogarev Mordovia State Univ., Saransk, Russia
fYear
2015
fDate
21-23 May 2015
Firstpage
1
Lastpage
3
Abstract
This paper describes the hardware and software package for automatic diagnostics of power semiconductor devices for thermal parameters and the current-voltage characteristics in a high conductivity.
Keywords
automatic test equipment; power engineering computing; power semiconductor devices; automatic diagnostics; current-voltage characteristics; diagnostics equipment; power semiconductor devices; software package; testing equipment; thermal parameters; Conductivity; Current-voltage characteristics; Power semiconductor devices; Semiconductor diodes; Temperature; Thermal conductivity; a state of high conductivity; current-voltage characteristic; hardware-software complex; power semiconductor devices; series connection diagnostics; thermal parameters; thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location
Omsk
Print_ISBN
978-1-4799-7102-2
Type
conf
DOI
10.1109/SIBCON.2015.7146999
Filename
7146999
Link To Document