DocumentCode
718569
Title
Automated test complex for operational amplifier ICS parametric and functioning monitoring
Author
Demidova, A.V. ; Borisov, A.Y. ; Kessarinskiy, L.N. ; Boychenko, D.V.
Author_Institution
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear
2015
fDate
21-23 May 2015
Firstpage
1
Lastpage
4
Abstract
The article discusses automated test complex based on the PXI devices basis for monitoring parameters and functioning of integrated opamp during radiation experiments. Need of measurements and input signals high accuracy support is specified.
Keywords
automatic testing; integrated circuit testing; operational amplifiers; radiation hardening (electronics); IC functioning monitoring; IC parametric monitoring; PXI devices; automated test complex; operational amplifier; radiation experiments; Current measurement; Nickel; Radiation effects; Semiconductor device measurement; Testing; Voltage control; Voltage measurement; input current; operational amplifier; radiation; tests of integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location
Omsk
Print_ISBN
978-1-4799-7102-2
Type
conf
DOI
10.1109/SIBCON.2015.7147036
Filename
7147036
Link To Document