Title :
Automated test complex for operational amplifier ICS parametric and functioning monitoring
Author :
Demidova, A.V. ; Borisov, A.Y. ; Kessarinskiy, L.N. ; Boychenko, D.V.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The article discusses automated test complex based on the PXI devices basis for monitoring parameters and functioning of integrated opamp during radiation experiments. Need of measurements and input signals high accuracy support is specified.
Keywords :
automatic testing; integrated circuit testing; operational amplifiers; radiation hardening (electronics); IC functioning monitoring; IC parametric monitoring; PXI devices; automated test complex; operational amplifier; radiation experiments; Current measurement; Nickel; Radiation effects; Semiconductor device measurement; Testing; Voltage control; Voltage measurement; input current; operational amplifier; radiation; tests of integrated circuits;
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
DOI :
10.1109/SIBCON.2015.7147036
