DocumentCode :
718927
Title :
Fabrication of thin-wall inverted pyramid hollow tips array and nano-aperture for maskless nanoscaled plasma patterning
Author :
Jie Liu ; Li Wen ; Han Li ; Hai Wang ; Jinlan Peng
Author_Institution :
Dept. of Precision Machinery & Instrum., Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2015
fDate :
7-11 April 2015
Firstpage :
498
Lastpage :
501
Abstract :
This paper reports a new maskless nanoscale patterning method based on microdischarge devices tips array. That is, inverted pyramid microplasma devices are integrated into the scanning probe hollow tips array with nano-apertures. A 2×2 inverted pyramidal thin-wall hollow tips array with each microcavity dimension of 50μm microdischarge devices are successfully fabricated by MEMS process. Nano-apertures at the hollow tips are fabricated by Focused Ion Beam(FIB). Experimental results demonstrated that the inverted pyramid array and sidewall of the hollow tips array have a high surface quality. This work plays an important role for future application of microplasma nanoscaled maskless patterning.
Keywords :
focused ion beam technology; microfabrication; micromechanical devices; nanopatterning; sputter etching; FIB; MEMS process; focused ion beam; inverted pyramid array; inverted pyramid microplasma devices; inverted pyramidal thin-wall hollow tips array; maskless nanoscale patterning method; microcavity dimension; microdischarge devices tips array; microplasma nanoscaled maskless patterning; nano-apertures; scanning probe hollow tips array; size 50 mum; surface quality; Arrays; Fabrication; Microcavities; Nanoscale devices; Plasmas; Wet etching; microplasma; nano-aperture; nano-scaled maskless patterning; tips array;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2015 IEEE 10th International Conference on
Conference_Location :
Xi´an
Type :
conf
DOI :
10.1109/NEMS.2015.7147477
Filename :
7147477
Link To Document :
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