Abstract :
The following topics are dealt with: Properties Extraction; Assertions Auto-generation; Clock Domain Imbalances; Test Architecture; SoC Designs; Satisfiability-Based Analysis; Radiation-Induced Errors; Reconfigurable Logic Fabrics; Complex Mixed-Signal Devices; At-Speed Path Delay Test; Failure Diagnosis; Compression Architectures; Multivalued Logic; and SoC Testing.
Keywords :
computability; fault diagnosis; logic circuits; logic design; multivalued logic; system-on-chip; SoC designs; SoC testing; assertions auto-generation; at-speed path delay test; clock domain imbalances; complex mixed-signal devices; compression architectures; failure diagnosis; multivalued logic; properties extraction; radiation-induced errors; reconfigurable logic fabrics; satisfiability-based analysis; test architecture;
Conference_Titel :
Test Workshop (NATW), 2015 IEEE 24th North Atlantic
Conference_Location :
Johnson City, NY
Print_ISBN :
978-1-4673-7416-3
DOI :
10.1109/NATW.2015.1
