DocumentCode :
71904
Title :
Fault Reconstruction and Fault-Tolerant Control via Learning Observers in Takagi–Sugeno Fuzzy Descriptor Systems With Time Delays
Author :
Qingxian Jia ; Wen Chen ; Yingchun Zhang ; Huayi Li
Author_Institution :
Res. Center of Satellite Technol., Harbin Inst. of Technol., Harbin, China
Volume :
62
Issue :
6
fYear :
2015
fDate :
Jun-15
Firstpage :
3885
Lastpage :
3895
Abstract :
This paper addresses the problems of observer-based fault reconstruction and fault-tolerant control for Takagi-Sugeno fuzzy descriptor systems subject to time delays and external disturbances. A novel fuzzy descriptor learning observer is constructed to achieve simultaneous reconstruction of system states and actuator faults. Sufficient conditions for the existence of the proposed observer are explicitly provided. Utilizing the reconstructed fault information, a reconfigurable fuzzy fault-tolerant controller based on the separation property is designed to compensate for the impact of actuator faults on system performance by stabilizing the closed-loop system. In addition, the design of the fault reconstruction observer and the fault-tolerant controller is formulated in terms of linear matrix inequalities that can be conveniently solved using convex optimization techniques. Finally, simulation results on a truck-trailer system are presented to verify the effectiveness of the proposed approaches.
Keywords :
actuators; control system synthesis; delays; fault tolerant control; fuzzy control; fuzzy systems; learning systems; observers; Takagi-Sugeno fuzzy descriptor system; fault reconstruction; fault-tolerant control; fuzzy descriptor learning observer; time delays; Actuators; Delay effects; Fault diagnosis; Fault tolerance; Fault tolerant systems; Observers; Symmetric matrices; Fault reconstruction; Fault-tolerant control; Learning observers; Linear matrix inequalities; TS uzzy descriptor systems; Takagi???Sugeno (T???S) fuzzy descriptor systems; fault-tolerant control (FTC); learning observers (LOs); linear matrix inequalities (LMIs);
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2015.2404784
Filename :
7045537
Link To Document :
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